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Special Issue

Optimizing Intensive Longitudinal Designs for Clinical Psychology Research and Assessment, Part 1

Psychological Assessment
October 2025
(Vol.37, No.10)
ISBN:
978-1-4338-9919-5
Item #
2163713
Format
PDF

Special Issue PDF
$24.95

APA Style leaf logo Cite This Webpage in APA Style
American Psychological Association. (2025). Optimizing Intensive Longitudinal Designs for Clinical Psychology Research and Assessment, Part 1. https://www.apa.org/pubs/journals/pas/pas-optimizing-intensive-longitudinal-designs-part-one-pdf

Special Issue Editors

Table of contents

View the table of contents with abstracts on APA PsycNetopens in new window

Introduction

Articles

  • Minimum Sampling Recommendations for Applied Ambulatory Assessment
    Aidan G. C. Wright, Florian Scharf, and Johannes Zimmermann
  • Cost-Effective Experience Sampling Method Studies: Integrating Budget Constraints Into Sample Size Decisions
    Jordan Revol, Ginette La.t, Olivia Kirtley, and Eva Ceulemans
  • Predicting Dropout in Intensive Longitudinal Data: Extending the Joint Model for Autocorrelated Data
    Fridtjof Petersen, Laura F. Bringmann, and Dimitris Rizopoulos
  • Considering How to Classify “Emotional” Episodes via Ecological Momentary Assessment
    Jennifer C. Veilleux and Caroline P. Dina
  • Evaluating the Feasibility of Episode-Contingent Experience Sampling Burst Designs
    Yuanyuan Ji, Marieke J. Schreuder, Sigert Ariens, Egon Dejonckheere, and Eva Ceulemans
  • Families Being Supportive Together: A Multimethod and Multi-Informant Intensive Longitudinal Study of Family Protective Mechanisms for Adolescent Depression
    Sunhye Bai, Nicole M. Froidevaux, Mengyun Chen, Andrew C. High, Kaitlyn E. Ewing, Jessica DeFelice, Jonathan Weaver, Kelly W. Ngigi, Meghan R. Riccio, Shou-Chun Chiang, Liu Bai, Erika S. Lunkenheimer, and Timothy R. Brick
  • Reducing Patient Burden in Experience Sampling Studies: A Simulation Study to Validate the Personalized Missingness Design
    J. Jongerling, M. P. J. Schellekens, M. Bolsinova, M. L. van der Lee, and L. V. D. E. Vogelsmeier